Patents/Inventors

Seungryeol Oh

Suwon-siKR5 patents

4 Patents

US126075732026
Defect Inspection Device and Defect Inspection Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125538342026
Substrate Inspection Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US123033072025
Semiconductor Device Measurement Method Using X-ray Scattering and Semiconductor Device Manufacturing Method Including the Measurement Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119884952024
Through-focus Image-based Metrology Device, Operation Method Thereof, and Computing Device for Executing the Operation
SAMSUNG ELECTRONICS CO., Ltd.
0 cites