8 Patents
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- US124760732025Scanning Electron Microscope Image-based Pitch Walk Inspection Method and Method of Manufacturing Semiconductor Device Comprising the Inspection Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123267112025Method and Computing Device for Manufacturing Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US120865262024Methods and Devices of Correcting Layout for Semiconductor Processes Using Machine Learning
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120449612024Method of Forming Mask Including Curvilinear Shape and Method of Forming Semiconductor Device
Samsung Electronics Co., Ltd.
0 cites - US119000432024Electronic Device for Manufacturing Semiconductor Device and Operating Method of Electronic Device
Samsung Electronics Co., Ltd.
0 cites - US116886872023Semiconductor Devices Having Landing Pad Patterns and Methods of Manufacturing the Same
Samsung Electronics Co., Ltd.
0 cites