Patents/Inventors

Seungbeom Park

Suwon-siKR4 patents

4 Patents

US125661442026
Semiconductor Inspection Apparatus
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124052262025
Substrate Inspection Apparatus and Substrate Inspection Method
TRUSTEES OF BOSTON UNIVERSITY
0 cites
US123680652025
Wafer Processing Apparatus
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US120387182024
Holographic Microscope and Manufacturing Method of Semiconductor Device Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites