Sergey Starik

3 Patents

• US120625832024

  Optical Metrology Models for In-line Film Thickness Measurements

  Applied Materials Israel Ltd.

  0 cites
• US118982492024

  PECVD Process

  Applied Materials, Inc.

  0 cites
• US116138122023

  PECVD Process

  Applied Materials, Inc.

  0 cites