5 Patents
- US126189022026Probe Card Including Power Compensation Circuit and Test System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US123284242025Interface Board for Testing Image Sensor, Test System Having the Same, and Operating Method Thereof
Samsung Electronics Co., Ltd.
0 cites - US123093532025Image Sensor Test System Including Operational Amplifier and Low-frequency Attenuator
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121051462024Wafer-level Multi-device Tester and System Including the Same Preliminary Class
Samsung Electronics Co., Ltd.
0 cites - US118434872023High Performance Receivers for Mobile Industry Processor Interfaces (MIPI) and Methods of Operating Same
Samsung Electronics Co., Ltd.
0 cites