Patents/Inventors

Seong Won Kwon

SeoulKR1 patent

2 Patents

US121594732024
Device for Analyzing Large-area Sample Based on Image, Device for Analyzing Sample Based on Image by Using Difference in Medium Characteristic, and Method for Measuring and Analyzing Sample Using the Same
SOL Inc.
0 cites
US116248992023
Device for Analyzing Large-area Sample Based on Image, Device for Analyzing Sample Based on Image by Using Difference in Medium Characteristic, and Method for Measuring and Analyzing Sample Using the Same
SOL Inc.
0 cites