Seong Mi Park

3 Patents

• US120139182024

  Method and Apparatus for Clustering Images

  SAMSUNG SDS CO., Ltd.

  0 cites
• US118165792023

  Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning

  SAMSUNG SDS CO., Ltd.

  0 cites
• US115872222023

  Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning

  SAMSUNG SDS CO., Ltd.

  0 cites