Patents/Inventors

Seokjung Yun

DaejeonKR3 patents

4 Patents

US123859462025
Method of Inspecting Tip of Atomic Force Microscope and Method of Manufacturing Semiconductor Device
KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology
0 cites
US121836772024
Three-dimensional Semiconductor Device
Samsung Electronics Co., Ltd.
0 cites
US120926562024
Test Apparatus and Test Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118549752023
Three-dimensional Semiconductor Device
Samsung Electronics Co., Ltd.
0 cites