3 Patents
- US124053032025Scan Chain Security Circuit and Driving Method Thereof
UIF (University Industry Foundation), Yonsei University
0 cites - US123126952025Etchant Composition, and Method for Manufacturing Metal Pattern and Thin Film Transistor Substrate Using the Same
Samsung Display Co., Ltd.
0 cites - US115671322023Scan Apparatus Capable of Fault Diagnosis and Scan Chain Fault Diagnosis Method
UIF (University Industry Foundation), Yonsei University
0 cites