6 Patents
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- US120384582024Probe for Testing a Semiconductor Device and a Probe Card Including the Same
KOREA INSTRUMENT CO., Ltd.
0 cites - US116176652023Hybrid-type Artificial Limb Device and Control Method Therefor
KOREA LABOR WELFARE CORPORATION CO., Ltd.
0 cites - US115858332023Probe Card Having Power Converter and Test System Including the Same
Samsung Electronics Co., Ltd.
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