Patents/Inventors

Sebastianus Adrianus Goorden

EindhovenNL19 patents

18 Patents

US125911842026
Enhanced Alignment for a Photolithographic Apparatus
ASML Netherlands B.V.
0 cites
US125851982026
Lithographic Apparatus, Multi-wavelength Phase-modulated Scanning Metrology System and Method
ASML HOLDING N.V.
0 cites
US125720832026
Intensity Order Difference Based Metrology System, Lithographic Apparatus, and Methods Thereof
ASML HOLDING N.V.
0 cites
US123395882025
High Force Low Voltage Piezoelectric Micromirror Actuator
ASML Netherlands B.V.
0 cites
US123266692025
Illumination Apparatus and Associated Metrology and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites
US122874702025
Dark Field Microscope
ASML NETHERLANDS B.V.
0 cites
US122875912025
Lithographic Apparatus, Metrology Systems, and Methods Thereof
ASML Netherlands B.V. & ASML Holding N.V.
0 cites
US122822632025
Metrology System and Lithographic System
ASML NETHERLANDS B.V.
0 cites
US122767842025
Micromirror Arrays
IMEC V.z.w.
0 cites
US122769212025
Substrate Comprising a Target Arrangement, and Associated at Least One Patterning Device, Lithographic Method and Metrology Method
ASML Netherlands B.V.
0 cites
US122595462025
Micromirror Arrays
ASML NETHERLANDS B.V.
0 cites
US121893142025
Metrology Method and Associated Metrology and Lithographic Apparatuses
ASML NETHERLANDS B.V.
0 cites
US120259252024
Metrology Method and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites
US119406082024
Dark Field Microscope
ASML NETHERLANDS B.V.
0 cites
US119278912024
Apparatus and Methods for Determining the Position of a Target Structure on a Substrate
ASML Netherlands B.V.
0 cites
US119069062024
Metrology Method and Associated Metrology and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites
US117623052023
Alignment Method
ASML Netherlands B.V.
0 cites
US116505132023
Apparatus and Method for Measuring a Position of a Mark
ASML Netherlands B.V.
0 cites