Sead Zildzic

8 Patents

• US126145832026

  Concurrent Scan Operation on Multiple Blocks in a Memory Device

  Micron Technology, Inc.

  0 cites
• US122177992025

  Parallelized Defect Detection Across Multiple Sub-blocks in a Memory Device

  Micron Technology, Inc.

  0 cites
• US122177942025

  Managing the Programming of an Open Translation Unit

  Micron Technology, Inc.

  0 cites
• US121701132024

  Concurrent Programming of Retired Wordline Cells with Dummy Data

  Micron Technology, Inc.

  0 cites
• US121059612024

  Copyback Clear Command for Performing a Scan and Read in a Memory Device

  Micron Technology, Inc.

  0 cites
• US121059672024

  Two-tier Defect Scan Management

  Micron Technology, Inc.

  0 cites
• US119230012024

  Managing the Programming of an Open Translation Unit

  Micron Technology, Inc.

  0 cites
• US117155472023

  Scan Optimization Using Data Selection Across Wordline of a Memory Array

  Micron Technology, Inc.

  0 cites