84 Patents
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- US124686002025Coordinated Error Correction0 cites
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- US123620312025Indicating a Status of a Memory Built-in Self-test for Multiple Memory Device Ranks
Micron Technology, Inc.
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- US123397402025Methods and Devices for Error Correction0 cites
- US123408602025Indicating a Status of a Memory Built-in Self-test Using a Data Mask Inversion Bit
Micron Technology, Inc.
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- US123216432025Memory Command Verification0 cites
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- US122877062025Memory Device with Status Feedback for Error Correction0 cites
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- US121894772025Targeted Command/address Parity Low Lift0 cites
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- US121410292024Internal Error Correction for Memory Devices0 cites
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- US120812352024Syndrome Check Functionality to Differentiate Between Error Types
Micron Technology, Inc.
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- US120514772024Indicating a Status of a Memory Built-in Self-test for Multiple Memory Device Ranks
Micron Technology, Inc.
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- US119841802024Enabling or Disabling On-die Error-correcting Code for a Memory Built-in Self-test
Micron Technology, Inc.
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- US119220632024Memory Command Verification0 cites
- US119070612024Methods and Devices for Error Correction0 cites
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- US117898182023Coordinated Error Correction0 cites
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- US117753852023Targeted Command/address Parity Low Lift0 cites
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- US117554092023Internal Error Correction for Memory Devices0 cites
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