Patents/Inventors

Scott Anderson Middlebrooks

DuizelNL14 patents

13 Patents

US125861702026
System and Method for Generating Predictive Images for Wafer Inspection Using Machine Learning
ASML Netherlands B.V.
0 cites
US125671642026
Apparatus and Method for Determining Three Dimensional Data Based on an Image of a Patterned Substrate
ASML NETHERLANDS B.V.
0 cites
US124932472025
Method and System for Predicting Process Information with a Parameterized Model
ASML Netherlands B.V.
0 cites
US122875842025
Methods and Apparatus for Obtaining Diagnostic Information Relating to an Industrial Process
ASML NETHERLANDS B.V.
0 cites
US122711142025
Method and Apparatus for Predicting Substrate Image
ASML NETHERLANDS B.V.
0 cites
US122596592025
Aligning a Distorted Image
ASML Netherlands B.V.
0 cites
US121122602024
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate
ASML Netherlands B.V.
0 cites
US119661682024
Method of Measuring Variation, Inspection System, Computer Program, and Computer System
ASML NETHERLANDS B.V.
0 cites
US119407402024
Methods and Apparatus for Obtaining Diagnostic Information Relating to an Industrial Process
ASML NETHERLANDS B.V.
0 cites
US118806402024
Systems and Methods for Predicting Layer Deformation
ASML NETHERLANDS B.V.
0 cites
US118475702023
Deep Learning for Semantic Segmentation of Pattern
ASML NETHERLANDS B.V.
0 cites
US117200292023
Method and Apparatus for Image Analysis
ASML NETHERLANDS B.V.
0 cites
US116255202023
Systems and Methods for Predicting Layer Deformation
ASML NETHERLANDS B.V.
0 cites