13 Patents
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- US125117292025Defect Classification Device and Defect Classification Program
Hitachi High-tech Corporation
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- US124068262025Charged Particle Beam Device and Sample Observation Method
HITACHI HIGH-TECH CORPORATION
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- US122103382025Computer System of Observation Device and Processing Method
Hitachi High-tech Corporation
0 cites - US121968022025Semiconductor Inspection Device and Method for Inspecting Semiconductor Sample
HITACHI HIGH-TECH CORPORATION
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- US117357852023Battery Device Including Battery Cell Group Configured by a Plurality of Laminated Battery Cells in Outer Packaging and Method for Manufacturing the Battery Device
HONDA MOTOR CO., Ltd.
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