Satoru Yamaguchi

5 Patents

• US121983272025

  Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure

  Hitachi High-tech Corporation

  0 cites
• US117911302023

  Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device

  Hitachi High-tech Corporation

  0 cites
• US116704812023

  Charged Particle Beam Device

  Hitachi High-tech Corporation

  0 cites
• US116262662023

  Charged Particle Beam Device

  Hitachi High-tech Corporation

  0 cites
• US115608282023

  Engine

  SUBARU CORPORATION

  0 cites