Patents/Inventors

Satoru Ishiguro

TokyoJP2 patents

3 Patents

US124678892025
Non-destructive Inspection Device and Non- Destructive Inspection System
RIKEN
0 cites
US123665422025
Nondestructive Inspection System
RIKEN
0 cites
US116144152023
Nondestructive Testing System and Nondestructive Testing Method
RIKEN
0 cites