9 Patents
- US124224662025Bonding Quality Test Method, Bonding Quality Test Circuit, and Memory Device Including Bonding Quality Test Circuit
Samsung Electronics Co., Ltd.
0 cites - US123216322025Image Processing Apparatus Including Line Buffer and Operation Method Thereof
Magnachip Mixed-signal, Ltd.
0 cites - US123148412025Memristor Device, Method of Fabricating Thereof, Synaptic Device Including Memristor Device and Neuromorphic Device Including Synaptic Device
Korea Advanced Institute Of Science And Technology
0 cites - 0 cites
- US117930062023Memristor Device, Method of Fabricating Thereof, Synaptic Device Including Memristor Device and Neuromorphic Device Including Synaptic Device
Korea Advanced Institute Of Science And Technology
0 cites - US116765572023Method and Device for Seamless Mode Transition Between Command Mode and Video Mode
MAGNACHIP SEMICONDUCTOR, Ltd.
0 cites - US116766802023SRAM Dynamic Failure Handling System Using CRC and Method for the Same
MAGNACHIP SEMICONDUCTOR, Ltd.
0 cites - US116003572023Static Random-access Memory (SRAM) Fault Handling Apparatus and SRAM Fault Handling Method
MAGNACHIP SEMICONDUCTOR, Ltd.
0 cites - US115692982023Image Sensors Having Lower Electrode Structures Below an Organic Photoelectric Conversion Layer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites