Patents/Inventors

Sangsoon Im

Suwon-siKR1 patent

2 Patents

US124553172025
Logic BIST Circuit and Semiconductor Device Including Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119599652024
Test Circuit Using Clock Gating Scheme to Hold Capture Procedure and Bypass Mode, and Integrated Circuit Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites