Sangho Yun

3 Patents

• US125717472026

  Overlay Measuring Method

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US117336012023

  EUV Photomask and Method of Forming Mask Pattern Using the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US116902132023

  Semiconductor Devices Having a Decreasing Height Gate Structure

  Samsung Electronics Co., Ltd.

  0 cites