Patents/Inventors

Sangbong Park

Danville, CAUS10 patents

10 Patents

US124820912025
Detecting Defects on Specimens
KLA CORPORATION
0 cites
US121905002025
Detecting Defects on Specimens
KLA Corp.
0 cites
US120568672024
Image Contrast Metrics for Deriving and Improving Imaging Conditions
KLA Corporation
0 cites
US119210522024
Inspection with Previous Step Subtraction
KLA Corporation
0 cites
US118039602023
Optical Image Contrast Metric for Optical Target Search
KLA Corporation
0 cites
US117834702023
Design-assisted Inspection for DRAM and 3D NAND Devices
KLA CORPORATION
0 cites
US117761082023
Deep Learning Based Defect Detection
KLA Corp.
0 cites
US117488722023
Setting Up Inspection of a Specimen
KLA Corp.
0 cites
US116195922023
Selecting Defect Detection Methods for Inspection of a Specimen
KLA Corp.
0 cites
US116159932023
Clustering Sub-care Areas Based on Noise Characteristics
KLA CORPORATION
0 cites