Sandip Halder

3 Patents

• US125117732025

  Wafer Image Denoising and Contour Extraction for Manufacturing Process Calibration

  Siemens Industry Software Inc.

  0 cites
• US122431932025

  Method for De-noising an Electron Microscope Image

  IMEC VZW

  0 cites
• US120667632024

  Sensitivity Improvement of Optical and SEM Defection Inspection

  KLA Corporation

  0 cites