22 Patents
- US125363572026Systems and Methods for Modeling via Defect
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
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- US123992112025Method of Testing an Integrated Circuit and Testing System
TSMC NANJING COMPANY, LIMITED
0 cites - US123859732025Scan Architecture for Interconnect Testing in 3D Integrated Circuits
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US123686842025Network-on-chip System and a Method of Generating the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US123146442025Integrated Circuit Design Method, System and Computer Program Product
TSMC NANJING COMPANY, LIMITED
0 cites - US123062482025Scan Chains with Multi-bit Cells and Methods for Testing the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US122048252025Function Safety and Fault Management Modeling at Electrical System Level (ESL)
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US120664902024Wrapper Cell Design and Built-in Self-test Architecture for 3DIC Test and Diagnosis
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120141302024System and Method for ESL Modeling of Machine Learning
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119496032024Network-on-chip System and a Method of Generating the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US118990642024Scan Architecture for Interconnect Testing in 3D Integrated Circuits
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US118799332024Method of Testing an Integrated Circuit and Testing System
TSMC NANJING COMPANY, LIMITED
0 cites - US118373082023Systems and Methods to Detect Cell-internal Defects
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US117271772023Integrated Circuit Design Method, System and Computer Program Product
TSMC NANJING COMPANY, LIMITED
0 cites - 0 cites
- 0 cites
- 0 cites
- US115499842023Scan Architecture for Interconnect Testing in 3D Integrated Circuits
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites