37 Patents
- US126188962026Active Thermal Interposer Device with Thermal Isolation Structures
Advantest Test Solutions, Inc.
0 cites - US126132732026Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US125409682026Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites - US125355222026Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites - US123744202025Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - US123457562025Integrated Test Cell Using Active Thermal Interposer (ATI) with Parallel Socket Actuation
Advantest Test Solutions, Inc.
0 cites - US123208412025Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites - US123208522025Passive Carrier-based Device Delivery for Slot-based High-volume Semiconductor Test System
Advantest Test Solutions, Inc.
0 cites - US122594272025Thermal Head Comprising a Plurality of Adapters for Independent Thermal Control of Zones
AEM Singapore Pte, Ltd.
0 cites - 0 cites
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- US122039792025Multi-input Multi-zone Thermal Control for Device Testing
Advantest Test Solutions, Inc.
0 cites - US122039582025Shielded Socket and Carrier for High-volume Test of Semiconductor Devices
Advantest Test Solutions, Inc.
0 cites - 0 cites
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- US118526782023Multi-input Multi-zone Thermal Control for Device Testing
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US118413922023Integrated Test Cell Using Active Thermal Interposer (ATI) with Parallel Socket Actuation
Advantest Test Solutiions, Inc.
0 cites - US118287952023Test System with a Thermal Head Comprising a Plurality of Adapters for Independent Thermal Control of Zones
AEM Holdings Ltd.
0 cites - US118219132023Shielded Socket and Carrier for High-volume Test of Semiconductor Devices
Advantest Test Solutions, Inc.
0 cites - US118088122023Passive Carrier-based Device Delivery for Slot-based High-volume Semiconductor Test System
Advantest Test Solutions, Inc.
0 cites - 0 cites
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- US117546202023DUT Placement and Handling for Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites - US117420552023Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US116749992023Wafer Scale Active Thermal Interposer for Device Testing
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US116562722023Test System with a Thermal Head Comprising a Plurality of Adapters and One or More Cold Plates for Independent Control of Zones
AEM Holdings Ltd.
0 cites - 0 cites
- US115876402023Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - US115732622023Multi-input Multi-zone Thermal Control for Device Testing
Advantest Test Solutions, Inc.
0 cites - US115671192023Testing System Including Active Thermal Interposer Device
Advantest Test Solutions, Inc.
0 cites - 0 cites