15 Patents
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- US124746402025Integration of Dry Development and Etch Processes for EUV Patterning in a Single Process Chamber
Lam Research Corporation
0 cites - US124354122025High Density, Modulus, and Hardness Amorphous Carbon Films at Low Pressure
Lam Research Corporation
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- US122781252025Integrated Dry Processes for Patterning Radiation Photoresist Patterning
Lam Research Corporation
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- US121836042024Integrated Dry Processes for Patterning Radiation Photoresist Patterning
Lam Research Corporation
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- US120625382024Atomic Layer Etch and Selective Deposition Process for Extreme Ultraviolet Lithography Resist Improvement
Lam Research Corporation
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