10 Patents
- US124368582025Scan Synchronous-write-through Testing Architectures for a Memory Device
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123817472025Authentication Based on Physically Unclonable Functions
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122447412025Physical Unclonable Function (PUF) Security Key Generation
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121356082024Memory Address Protection Circuit Including an Error Detection Circuit and Method of Operating Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US118990642024Scan Architecture for Interconnect Testing in 3D Integrated Circuits
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US118561152023Physical Unclonable Function (PUF) Security Key Generation
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US117777472023Authentication Based on Physically Unclonable Functions
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US117341422023Scan Synchronous-write-through Testing Architectures for a Memory Device
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US117147052023Memory Address Protection Circuit and Method of Operating Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115499842023Scan Architecture for Interconnect Testing in 3D Integrated Circuits
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites