4 Patents
- US125481422026Machine Learning Techniques for Wafer Defect Map Classification
Stmicroelectronics International N.V.
0 cites - 0 cites
- US119018632024Capacitively-coupled Stacked Class-d Oscillators for Galvanic Isolation
STMICROELECTRONICS S.R.L.
0 cites - US116216702023Capacitively-coupled Stacked Class-d Oscillators for Galvanic Isolation
Université Degli Studi Di Catania
0 cites