Patents/Inventors

Sai Marapareddy

Newark, CAUS2 patents

3 Patents

US121362052024
Image-based Defects Identification and Semi-supervised Localization
Samsung Display Co., Ltd.
0 cites
US119483472024
Fusion Model Training Using Distance Metrics
Samsung Display Co., Ltd.
0 cites
US116943192023
Image-based Defects Identification and Semi-supervised Localization
Samsung Display Co., Ltd.
0 cites