Ryusuke Imai

2 Patents

• US125732752026

  Abnormality Determination Method, Abnormality Determination Apparatus, Abnormality Determination System, and Non-transitory Computer-readable Medium

  NEC CORPORATION

  0 cites
• US117424542023

  Method for Manufacturing Concentrator Photovoltaic Module, and Transport Jig

  SUMITOMO ELECTRIC INDUSTRIES, Ltd.

  0 cites