3 Patents
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- US120211602024Semiconductor Wafer, Radiation Detection Element, Radiation Detector, and Production Method for Compound Semiconductor Monocrystalline Substrate
JX METALS CORPORATION
0 cites - US119676592024Semiconductor Wafer, Radiation Detection Element, Radiation Detector, and Production Method for Compound Semiconductor Monocrystalline Substrate
JX METALS CORPORATION
0 cites