5 Patents
- US125618232026Structure Estimation System and Structure Estimation Program for Estimating Height of Structure Based on Data from Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites - US123940382025Image Processing Program, Image Processing Device, and Image Processing Method
Hitachi High-tech Corporation
0 cites - US121983272025Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
Hitachi High-tech Corporation
0 cites - 0 cites
- US117911302023Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device
Hitachi High-tech Corporation
0 cites