Patents/Inventors

Ruchi Bora

LucknowIN1 patent

2 Patents

US125005802025
System and Method for Validating Critical Paths of Integrated Circuits
NXP B.V.
0 cites
US121644012024
Method and Apparatus to Inject Errors in a Memory Block and Validate Diagnostic Actions for Memory Built-in-self-test (MBIST) Failures
NXP B.V.
0 cites