Patents/Inventors

Roy Werkman

EindhovenNL10 patents

9 Patents

US125911772026
Method for Obtaining Training Data for Training a Model of a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US125786532026
Method for Determining a Sampling Scheme, a Semiconductor Substrate Measurement Apparatus, a Lithographic Apparatus
ASML NETHERLANDS B.V.
0 cites
US124932852025
Determining a Correction to a Process
ASML NETHERLANDS B.V.
0 cites
US123668092025
Methods and Apparatus for Controlling a Lithographic Process
ASML NETHERLANDS B.V.
0 cites
US122769192025
Method for Controlling a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US121241792024
Method of Wafer Alignment Using at Resolution Metrology on Product Features
ASML NETHERLANDS B.V.
0 cites
US119948452024
Determining a Correction to a Process
ASML NETHERLANDS B.V.
0 cites
US117549312023
Method for Determining Corrections for Lithographic Apparatus
ASML NETHERLANDS B.V.
0 cites
US116690172023
Method for Controlling a Manufacturing Apparatus and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites