Patents/Inventors

Ronja Capellmann

WetzlarDE2 patents

3 Patents

US120991852024
Method for Correcting a Spherical Aberration of a Microscope, and Microscope
LEICA MICROSYSTEMS CMS GmbH
0 cites
US119715312024
Method and Microscope for Determining the Thickness of a Cover Slip or Slide
LEICA MICROSYSTEMS CMS GmbH
0 cites
US116356082023
Method and Microscope for Determining the Refractive Index of an Optical Medium
LEICA MICROSYSTEMS CMS GmbH
0 cites