Rong-yang Lai

8 Patents

• US126017592026

  Cantilever Probe Card Device and Light Scattering Probe

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US125909902026

  Cantilever Probe Card Device and Micro Electro Mechanical System (MEMS) Probe

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US125909942026

  Cantilever Probe Card Device and Solder Receiving Probe

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US124679492025

  Cantilever Probe Card Device and Light Absorption Probe

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US121814962024

  Cantilever Probe Card and Probe Module Thereof

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US120926612024

  Cantilever Probe Card Device and Elastic Probe Thereof

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US119139732024

  Cantilever Probe Card Device and Focusing Probe Thereof

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites
• US118799122024

  Cantilever Probe Card and Carrier Thereof

  CHUNGHWA PRECISION TEST TECH. CO., Ltd.

  0 cites