Patents/Inventors

Ronald Van Ittersum

TilburgNL2 patents

3 Patents

US126079422026
Metrology Methods and Apparatuses for Lithographic Performance Parameter Evaluation Using Probability Descriptions
ASML NETHERLANDS B.V.
0 cites
US117969202023
Method for Controlling a Manufacturing Process and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites
US116690172023
Method for Controlling a Manufacturing Apparatus and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites