9 Patents
- US125607912026Method and Light Microscope for Localizing Individual Emitters in a Sample
Abberior Instruments GmbH
0 cites - US125107402025Method and Apparatus for High-resolution Localization of a Single Emitter in Multiple Spatial Directions
ABBERIOR INSTRUMENTS GmbH
0 cites - US123063922025Method, Apparatus and Computer Program for Localizing an Emitter in a Sample
ABBERIOR INSTRUMENTS GmbH
0 cites - US122593292025Method of Disturbance Correction, and Laser Scanning Microscope Having Disturbance Correction
ABBERIOR INSTRUMENTS GmbH
0 cites - US121814132024Method, Computer Program, and Apparatus for Adapting an Estimator for Use in a Microscope
Abberior Instruments GmbH
0 cites - 0 cites
- US120557282024Method and Light Microscope for a High-resolution Examination of a Sample
ABBERIOR INSTRUMENTS GmbH
0 cites - US119670902024Method of and Microscope Comprising a Device for Detecting Movements of a Sample with Respect to an Objective
Abberior Instruments GmbH
0 cites - US119337292024Method, Computer Program, and Apparatus for Adapting an Estimator for Use in a Microscope
ABBERIOR INSTRUMENTS GmbH
0 cites