Patents/Inventors

Roman Kris

JerusalemIL3 patents

4 Patents

US123477342025
Examination of a Hole Formed in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US117561882023
Determining a Critical Dimension Variation of a Pattern
Applied Materials Israel Ltd.
0 cites
US116865712023
Local Shape Deviation in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US116515092023
Method, System and Computer Program Product for 3D-NAND CDSEM Metrology
Applied Materials Israel Ltd.
0 cites