61 Patents
- US126158132026Gate-all-around Integrated Circuit Structures Having Vertically Discrete Source or Drain Structures
Intel Corporation
0 cites - US126105272026Integrated Circuit Structures Having Memory Access Transistor with Backside Contact
Intel Corporation
0 cites - US125884852026Integrated Circuit Structures Having Airgaps for Backside Signal Routing or Power Delivery
Intel Corporation
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- US124713622025Integrated Circuit Structures Having Ultra-high Conductivity Global Routing
Intel Corporation
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- US123494202025Device, Method and System to Provide a Stressed Channel of a Transistor
Intel Corporation
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- US123100442025Vertical Integration Scheme and Circuit Elements Architecture for Area Scaling of Semiconductor Devices
Intel Corporation
0 cites - US122888102025Backside Contact Structures and Fabrication for Metal on Both Sides of Devices
Intel Corporation
0 cites - US122888132025Gate-all-around Integrated Circuit Structures Having Insulator Fin on Insulator Substrate
Intel Corporation
0 cites - US122888072025Amorphization and Regrowth of Source-drain Regions from the Bottom-side of a Semiconductor Assembly
Intel Corporation
0 cites - US122551372025Sideways Vias in Isolation Areas to Contact Interior Layers in Stacked Devices
Intel Corporation
0 cites - US122243262025Contact Architecture for Capacitance Reduction and Satisfactory Contact Resistance
Intel Corporation
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- US121764292024Wrap-around Contact Structures for Semiconductor Nanowires and Nanoribbons
Intel Corporation
0 cites - US121070852024Interconnect Techniques for Electrically Connecting Source/drain Regions of Stacked Transistors
Intel Corporation
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- US120338962024Isolation Wall Stressor Structures to Improve Channel Stress and Their Methods of Fabrication
Intel Corporation
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- US119845062024Field Effect Transistor Having a Gate Dielectric with a Dipole Layer and Having a Gate Stressor Layer
Intel Corporation
0 cites - US119424162024Sideways Vias in Isolation Areas to Contact Interior Layers in Stacked Devices
Intel Corporation
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- US119358912024Non-silicon N-type and P-type Stacked Transistors for Integrated Circuit Devices
Intel Corporation
0 cites - US119359332024Backside Contact Structures and Fabrication for Metal on Both Sides of Devices
Intel Corporation
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- US118942622024Back Side Processing of Integrated Circuit Structures to Form Insulation Structure Between Adjacent Transistor Structures
Intel Corporation
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- US118627022024Gate-all-around Integrated Circuit Structures Having Insulator FIN on Insulator Substrate
Intel Corporation
0 cites - US118548942023Integrated Circuit Device Structures and Double-sided Electrical Testing
Intel Corporation
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- US118241072023Wrap-around Contact Structures for Semiconductor Nanowires and Nanoribbons
Intel Corporation
0 cites - US118240972023Contact Architecture for Capacitance Reduction and Satisfactory Contact Resistance
Intel Corporation
0 cites - US117989912023Amorphization and Regrowth of Source-drain Regions from the Bottom-side of a Semiconductor Assembly
Intel Corporation
0 cites - US117988382023Capacitance Reduction for Semiconductor Devices Based on Wafer Bonding
Intel Corporation
0 cites - US117423462023Interconnect Techniques for Electrically Connecting Source/drain Regions of Stacked Transistors
Intel Corporation
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- US116887802023Deep Source and Drain for Transistor Structures with Back-side Contact Metallization
Intel Corporation
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- US116582212023Backside Contact Structures and Fabrication for Metal on Both Sides of Devices
Intel Corporation
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- US116521072023Substrate-less Finfet Diode Architectures with Backside Metal Contact and Subfin Regions
Intel Corporation
0 cites - US116409612023III-V Source/drain in Top NMOS Transistors for Low Temperature Stacked Transistor Contacts
Intel Corporation
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- US116160602023Techniques for Forming Gate Structures for Transistors Arranged in a Stacked Configuration on a Single Fin Structure
Intel Corporation
0 cites - US116160152023Integrated Circuit Device with Back-side Interconnection to Deep Source/drain Semiconductor
Intel Corporation
0 cites - US116055562023Back Side Processing of Integrated Circuit Structures to Form Insulation Structure Between Adjacent Transistor Structures
Intel Corporation
0 cites - 0 cites
- US115737982023Stacked Transistors with Different Gate Lengths in Different Device Strata
Intel Corporation
0 cites - US115576762023Device, Method and System to Provide a Stressed Channel of a Transistor
Intel Corporation
0 cites - US115521042023Stacked Transistors with Dielectric Between Channels of Different Device Strata
Intel Corporation
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