Patents/Inventors

Rigalantu Ji

ChangchunCN1 patent

2 Patents

US121887932025
Heterodyne Two-dimensional Grating Measuring Device and Measuring Method Thereof
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
0 cites
US118600572024
Heterodyne One-dimensional Grating Measuring Device and Measuring Method Thereof
CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES
0 cites