Richard Johannes Franciscus Van Haren

6 Patents

• US124293282025

  Metrology Method, Target and Substrate

  ASML NETHERLANDS B.V.

  0 cites
• US122875842025

  Methods and Apparatus for Obtaining Diagnostic Information Relating to an Industrial Process

  ASML NETHERLANDS B.V.

  0 cites
• US122543922025

  Apparatus and Method for Property Joint Interpolation and Prediction

  ASML NETHERLANDS B.V.

  0 cites
• US121893082025

  Method for Adjusting a Target Feature in a Model of a Patterning Process Based on Local Electric Fields

  ASML NETHERLANDS B.V.

  0 cites
• US119407402024

  Methods and Apparatus for Obtaining Diagnostic Information Relating to an Industrial Process

  ASML NETHERLANDS B.V.

  0 cites
• US116198842023

  Method for Adjusting a Target Feature in a Model of a Patterning Process Based on Local Electric Fields

  ASML NETHERLANDS B.V.

  0 cites