Riccardo Emanuele Sarpietro

2 Patents

• US125481422026

  Machine Learning Techniques for Wafer Defect Map Classification

  Stmicroelectronics International N.V.

  0 cites
• US124871872025

  System and Method for Power Module Defect Detection

  Stmicroelectronics S.r.l.

  0 cites