Reum Oh

7 Patents

• US122992962025

  Semiconductor Memory Device and Method of Adjusting Operation Condition of the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US122508072025

  Semiconductor Device Using Different Types of Through-silicon-vias

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US122039802025

  Wafer Level Methods of Testing Semiconductor Devices Using Internally-generated Test Enable Signals

  Samsung Electronics Co., Ltd.

  0 cites
• US118677512024

  Wafer Level Methods of Testing Semiconductor Devices Using Internally-generated Test Enable Signals

  Samsung Electronics Co., Ltd.

  0 cites
• US118292242023

  Method of Operating Memory Device and Memory Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US116814572023

  High Bandwidth Memory Device and System Device Having the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US115993012023

  Semiconductor Memory Device and System Including the Same

  Samsung Electronics Co., Ltd.

  0 cites