Patents/Inventors

Randall J. Rooney

Boise, IDUS29 patents

22 Patents

US126204302026
Apparatuses and Methods for Monitored Refresh Management Operations
Micron Technology, Inc.
0 cites
US125674572026
Memory Devices and Systems Configured to Communicate a Delay Signal and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US124888242025
Memory with Deterministic Worst-case Row Address Servicing, and Associated Systems, Devices, and Methods
Micron Technology, Inc.
0 cites
US124750672025
Methods for Performing Multiple Memory Operations in Response to a Single Command and Memory Devices and Systems Employing the Same
0 cites
US124368312025
Normalization of Detecting and Reporting Failures for a Memory Device
0 cites
US124302052025
Methods for Error Count Reporting with Scaled Error Count Information, and Memory Devices Employing the Same
0 cites
US123003492025
Memory Module Multiple Port Buffer Techniques
Micron Technology, Inc.
0 cites
US121977662025
Error Injection Methods Using Soft Post-package Repair (sppr) Techniques and Memory Devices and Memory Systems Employing the Same
Micron Technology, Inc.
0 cites
US121833832024
Methods for Row Hammer Mitigation and Memory Devices and Systems Employing the Same
0 cites
US120560082024
Error Check and Scrub for Semiconductor Memory Device
0 cites
US120032522024
Error Correcting Code Poisoning for Memory Devices and Associated Methods and Systems
Micron Technology, Inc.
0 cites
US119961352024
Memory Devices and Systems Configured to Communicate a Delay Signal and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US119774442024
Methods for Error Count Reporting with Scaled Error Count Information, and Memory Devices Employing the Same
0 cites
US118546552023
Methods for Providing Device Status in Response to Read Commands Directed to Write-only Mode Register Bits and Memory Devices and Systems Employing the Same
0 cites
US118106102023
Methods for Row Hammer Mitigation and Memory Devices and Systems Employing the Same
0 cites
US117754592023
Methods for Performing Multiple Memory Operations in Response to a Single Command and Memory Devices and Systems Employing the Same
0 cites
US117214062023
Generating Test Data for a Memory System Design Based on Operation of a Test System, and Related Methods, Devices, and Systems
Micron Technology, Inc.
0 cites
US116988312023
Methods for Error Count Reporting with Scaled Error Count Information, and Memory Devices Employing the Same
Micron Technology, Inc.
0 cites
US116874102023
Error Check and Scrub for Semiconductor Memory Device
Micron Technology, Inc.
0 cites
US116640842023
Memory Device On-die ECC Data
Micron Technology, Inc.
0 cites
US116046942023
Error Correction in Row Hammer Mitigation and Target Row Refresh
Micron Technology, Inc.
0 cites
US115942982023
Word Line Characteristics Monitors for Memory Devices and Associated Methods and Systems
Micron Technology, Inc.
0 cites