7 Patents
- US125730242026Image Augmentation for Machine Learning Based Defect Examination
Applied Materials Israel Ltd.
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- US123211022025Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
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- US118158192023Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites - 0 cites