4 Patents
- US124688732025Systems and Methods for Predicting Film Thickness Using Virtual Metrology
Applied Materials, Inc.
0 cites - US119894952024Systems and Methods for Predicting Film Thickness Using Virtual Metrology
Applied Materials, Inc.
0 cites - US118625202024Systems and Methods for Predicting Film Thickness of Individual Layers Using Virtual Metrology
Applied Materials, Inc.
0 cites - US118429102023Detecting Outliers at a Manufacturing System Using Machine Learning
APPLIED MATERIALS, Inc.
0 cites