Ralph Brinkhof

4 Patents

• US126191592026

  Method for Modeling Measurement Data Over a Substrate Area and Associated Apparatuses

  ASML Netherlands B.V.

  0 cites
• US122769192025

  Method for Controlling a Semiconductor Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites
• US121893142025

  Metrology Method and Associated Metrology and Lithographic Apparatuses

  ASML NETHERLANDS B.V.

  0 cites
• US120322992024

  Metrology Method and Associated Metrology and Lithographic Apparatuses

  ASML NETHERLANDS B.V.

  0 cites