8 Patents
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- US123528022025Circuits and Techniques for Predicting End of Life Based on in Situ Monitors and Limit Values Defined for the in Situ Monitors
Infineon Technologies AG
0 cites - US123092282025Security and Reliability Detection for a Sensor Communication Channel
Infineon Technologies AG
0 cites - US122542542025Circuits and Techniques for Predicting Failure of Circuits Based on Stress Origination Metrics and Stress Victim Events
Infineon Technologies AG
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- US118219352023Differential Aging Monitor Circuits and Techniques for Assessing Aging Effects in Semiconductor Circuits
Infineon Technologies AG
0 cites - US117332882023Circuits and Techniques for Assessing Aging Effects in Semiconductor Circuits
Infineon Technologies AG
0 cites - US116092652023End-of-life Prediction for Circuits Using Accelerated Reliability Models and Sensor Data
Infineon Technologies AG
0 cites