Patents/Inventors

Rafael C. Howell

Santa Clara, CAUS9 patents

9 Patents

US122102912025
Aberration Impact Systems, Models, and Manufacturing Processes
ASML NETHERLANDS B.V.
0 cites
US120929632024
Method of Determining Characteristic of Patterning Process Based on Defect for Reducing Hotspot
ASML NETHERLANDS B.V.
0 cites
US119773342024
Wavefront Optimization for Tuning Scanner Based on Performance Matching
ASML NETHERLANDS B.V.
0 cites
US119721942024
Method for Determining Patterning Device Pattern Based on Manufacturability
ASML NETHERLANDS B.V.
0 cites
US117893712023
Methods of Determining Scattering of Radiation by Structures of Finite Thicknesses on a Patterning Device
ASML NETHERLANDS B.V.
0 cites
US117344902023
Method for Determining Curvilinear Patterns for Patterning Device
ASML NETHERLANDS B.V.
0 cites
US116146902023
Methods of Tuning Process Models
ASML NETHERLANDS B.V.
0 cites
US115861142023
Wavefront Optimization for Tuning Scanner Based on Performance Matching
ASML Netherlands B.V.
0 cites
US115802892023
Method for Determining Patterning Device Pattern Based on Manufacturability
ASML Netherlands B.V.
0 cites