Patents/Inventors

Rafael Bistritzer

Petach TikvaIL10 patents

10 Patents

US123615262025
Reconstruction of a Distorted Image of an Array of Structural Elements of a Specimen
Applied Materials Israel Ltd.
0 cites
US123477342025
Examination of a Hole Formed in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US122998682025
Control of a Manufacturing Process Using Contour Curvature Analysis of Specimens
Applied Materials Israel Ltd.
0 cites
US122777502025
Identification of an Array in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US122720422025
Detection of Defects Using a Computationally Efficient Segmentation Approach
Applied Materials Israel Ltd.
0 cites
US119533162024
Geometry Based Three Dimensional Reconstruction of a Semiconductor Specimen by Solving an Optimization Problem, Using at Least Two SEM Images Acquired at Different Illumination Angles
Applied Materials Israel Ltd.
0 cites
US119210632024
Lateral Recess Measurement in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US117981382023
Reconstruction of a Distorted Image of an Array of Structural Elements of a Specimen
Applied Materials Israel Ltd.
0 cites
US116865712023
Local Shape Deviation in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US116458312023
Identification of an Array in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites